Molecular Imaging Corporation

BETTER IMAGING IN FLUIDS

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;

BETTER IMAGING THROUGH ELECTROCHEMISTRY

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;

BIOTREC

Scanning probe microscope (SPM) probe derivatization kits, consisting primarily of chemical reagents and chemical crosslinking agents used to attach a biological or chemical sensor to AFM cantilever tips for scientific or research use;

FREESTANDING

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;FREESTANDING;

FREESTANDING

scanning probe microscopes, namely, atomic force microscopes, and scanning tunneling microscopes;

MOLECULAR IMAGING

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;

PICO

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;

PICOAFM

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;

PICOMAPS

SCIENTIFIC AND LABORATORY EQUIPMENT, NAMELY SUB-MICRON POSITIONING SAMPLE STAGES FOR USE WITH SCANNING PROBE AND ATOMIC FORCE MICROSCOPES;

PICOSCAN

electronic control station for scanning probe microscopes, comprising a central processing unit, disc tower, computer monitor, keyboard and software, for use in the operation of scanning probe microscopes and the examination of samples procured through application of scanning probe microscopy;PICO SCAN;

PICOSPM

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;

PICOSTAGE

SCIENTIFIC AND LABORATORY EQUIPMENT, NAMELY SUB-MICRON POSITIONING SAMPLE STAGES FOR USE WITH SCANNING PROBE AND ATOMIC FORCE MICROSCOPES;PICO STAGE;

PICOSTAT

combination potentiometer and galvanometer;PICO STAT;

PICOSTM

scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;

PICOTREC

topography and recognition imaging atomic force microscope (AFM) and microprocessor, controller, amplifier, laser, piezoelectric transducer and position sensitive detector used to chart variations in the topography of a sample and the presence of chemical or biological agents on the surface of a sample, all for use with atomic force microscopes;

PICOVIEW

computer programs, namely, a graphical user interface and instrument control software for use with in the fields of atomic force microscopy and scanning probe microscopy;

TREC

topography and recognition imaging atomic force microscope (AFM) and microprocessor, controller, amplifier, laser, piezoelectric transducer and position sensitive detector used to chart variations in the topography of a sample and the presence of chemical or biological agents on the surface of a sample all for use with atomic force microscopes;TREK;scanning probe microscope (SPM) probe derivatization kits, consisting primarily of chemical reagents and chemical crosslinking reagents used to attach a biological or chemical sensor to AFM cantilever tips for scientific or research use;

VISUAL AFM

image processing software for use in the field of atomic force microscopy,;AFM;

VISUAL SPM

image processing software for use in the field of scanning probe microscopy,;SPM;