SCANNING PROBE MICROSCOPES

Brand Owner (click to sort) Address Description
BETTER IMAGING IN FLUIDS Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;
BETTER IMAGING THROUGH ELECTROCHEMISTRY Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;
BLAZE Miltenyi Biotec B.V. & Co. KG Friedrich-Ebert-Straße 68 51429 Bergisch Gladbach Germany scanning probe microscopes; microscopes; microscopes for medical use; fluorescence microscopes; biological microscopes; all of the forgoing for use in the 3D visualization of cells within a whole organ or body;
BUDGETSENSORS NANOWORLD AG Rue Jaquet-Droz 1 CP 216 Neuchâtel CH-2002 Switzerland [ Scanning probe microscopes, scanning electronic microscopes and atomic force microscopes; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for non-optical microscopes and optical near field microscopes; [ electric and electronic and micro-mechanical and micro-electromechanical instruments and apparatus for detection of pressure, gases, temperature, intensity of light, forces, acceleration, vibrations, nick angle, humidity, distances, speed, roughness, thickness, acoustic waves, and molecules for measuring surface topography, height, electrical and magnetical surface properties,potentials and currents, and for applying electromagnetic irradiation, temperatures, mechanical, electrical and magnetical forces, currents and potentials to a substrate; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for atomic force microscopy, for scanning probe microscopy, and for scanning electronic microscopy; electric and electronic and micro-mechanical and micro-electromechanical sensors comprised of micro-mechanical cantilevers and membranes;BUDGET SENSORS;
ENVIROSCOPE Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 SCANNING PROBE MICROSCOPES;ENVIRON SCOPE;
FREESTANDING Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;FREESTANDING;
FREESTANDING Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely, atomic force microscopes, and scanning tunneling microscopes;
METRIS BURLEIGH INSTRUMENTS, INC. 7647 Main Street Fishers NY 14453 scanning probe microscopes;
MOLECULAR IMAGING Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;
NANOSCOPE Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 scanning probe microscopes; software for operating scanning probe microscopes;NANO SCOPE;
NVB OLYMPUS OPTICAL COMPANY LIMITED Tokyo Japan scanning probe microscopes;
OMPM OLYMPUS CORPORATION 2951 Ishikawa-machi, Hachioji-shi, Tokyo 192-8507 Japan scanning probe microscopes;
PICO Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;
PICO AGILENT TECHNOLOGIES, INC. 5301 Stevens Creek Boulevard Santa Clara CA 95051 Scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;
PICOAFM Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;
PICOSPM Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;
PICOSTM Molecular Imaging Corporation 4666 South Ash Avenue Tempe AZ 85282 scanning probe microscopes, namely atomic force microscopes and scanning tunneling microscopes;
PULSED FORCE MODE WITec Wissenschaftliche Instrumente undTecnologie GmbH Hörvelsinger Weg 6 Ulm D-89081 Germany SCANNING PROBE MICROSCOPES;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The present invention discloses a front-wing cantilever for the conductive probe of electrical scanning probe microscopes, wherein two symmetrical front wings are installed to extend from two lateral sides of the front end of the cantilever so that those two front wings are positioned on two lateral sides of the conductive tip. The front-wing structure of the cantilever can effectively inhibit the optical perturbation in the electrical scanning probe microscopes and obviously promote the analysis accuracy thereof. The front-wing structure can provide the scanned region with an effective dark field lest the optical absorption appears in the scanned region of semiconductor specimen and inhibit the optical perturbation occurs during the measurement and analysis of the differential capacitance.