IDENTIFY EQUIPMENT

Brand Owner (click to sort) Address Description
EASE J.A. WOOLLAM CO. INC. 645 M ST. LINCOLN NE 68508 IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, INCLUDING TEMPERATURE CAUSED EFFECTS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA;
HEATCELL J.A. WOOLLAM CO. INC. 645 M ST. LINCOLN NE 68508 IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, INCLUDING TEMPERATURE CAUSED EFFECTS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA;HEAT CELL;
ISE J.A. WOOLLAM CO. INC. 645 M ST. LINCOLN NE 68508 IDENTIFY EQUIPMENT, namely, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA;
TEMPRAMP J.A. WOOLLAM CO. INC. 645 M ST. LINCOLN NE 68508 IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, INCLUDING TEMPERATURE CAUSED EFFECTS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA;TEMP RAMP;
VASEMANAGER J.A. WOOLLAM CO. INC. 645 M ST. LINCOLN NE 68508 IDENTIFY EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, AND EFFECTS CAUSED BY TEMPERATURE CHANGES; AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA;VASE MANAGER;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Computerized method and system for guiding personnel servicing equipment requiring repair while at an equipment work site are provided. The personnel is guided through a plurality of tasks for evaluating the health of the equipment to identify the nature and extent of service needed, and determining at least one preferred work site location for performing the services based on technical and business decision-making criteria.