ELECTRO SCIENTIFIC INDUSTRIES, INC.

AKROS

HARDWARE FOR ELECTRICAL AND ELECTRONIC INSTRUMENTS-NAMELY, BINDING POSTS, METAL BOXES, CABINETS, DIALS, INSTRUMENT FRAMES, AND KNOBS;

CALCUMETER

COMBINATION ELECTRONIC CALCULATOR AND METER FOR MEASURING AND CALCULATING ELECTRICAL CHARACTERISTICS;

CHIPTRIM

software for laser based systems for industrial manufacturing in the field of electronic circuits and radio frequency components;CHIP TRIM;

DEKAMATIC

REMOTELY ACTUATED DEVICE FOR ESTABLISHING MAGNITUDES OR RATIOS OF IMPEDANCE;

DEKAVIDER

VOLTAGE DIVIDERS;

ESI

In the heading, reclassify US Class 26 to International Class 9.;APPARATUS AND COMPONENTS THEREOF FOR SUPPLYING AND/OR MEASURING ELECTRICAL CHARACTERISTICS-NAMELY, RESISTANCE, CAPACITANCE, [ INDUCTANCE, ] REACTANCE, DISSIPATION FACTOR AND THE RECIPROCALS THEREOF, VOLTAGE, CURRENT, PHASE ANGLE, FREQUENCY, POWER, AND POWER FACTOR;

ESI

LASER SYSTEMS COMPRISING MICRO COMPUTERS, TELEVISION MONITORS, ELECTRICAL MEASUREMENT, TESTING AND CONTROL INSTRUMENTS, AND COMPUTER PROGRAMS [ WITH PRE-RECORDED INFORMATION ON PAPER, TAPE AND CARDS ];IN THE STATEMENT, COLUMN 2, LINES 5 AND 6, WITH PRE-RECORDED INFORMATION ON PAPER, TAPE AND CARDS IS DELETED.;

ESI

The drawing is amended to appear as follows: PUBLISH NEW CUT;APPARATUS AND COMPONENTS THEREOF FOR SUPPLYING AND/OR MEASURING ELECTRICAL CHARACTERISTICS-NAMELY, RESISTANCE, CAPACITANCE, [ INDUCTANCE, ] REACTANCE, DISSIPATION FACTOR AND THE RECIPROCALS THEREOF, VOLTAGE, CURRENT, PHASE ANGLE, FREQUENCY, POWER, POWER FACTOR, AND LASER SYSTEMS COMPRISING MICRO COMPUTERS, TELEVISION MONITORS, ELECTRICAL MEASUREMENT TESTING AND CONTROL INSTRUMENTS, AND COMPUTER PROGRAMS [ WITH PRE-RECORDED INFORMATION ON PAPER, TAPE AND CARDS ];IN THE STATEMENT, COLUMN 2, LINES 3 AND 4, WITH PRE-RECORDED INFORMATION ON PAPER, TAPE AND CARDS IS DELETED.;IN THE STATEMENT, COLUMN 1, LINE 2, INC. SHOULD BE INSERTED, BEFORE (OREGON CORPORATION);

ESI

Electronic and microprocessor controlled machines and parts therefor for use in manufacturing semiconductors, passive electronic components, semiconductor packages, printed circuit boards and components therefor; computer hardware; [ machine vision systems comprised of computer hardware and software used for digital image processing and analysis in manufacturing and industrial automation; ] software for operating equipment for producing electronic products and controlling processes for inspection of products produced;Drilling machines and structural and replacement parts therefor;

FREEDOM SERIES

computer hardware and software for automating manufacturing processes and industrial inspection;

GEODE

Laser equipment for non-medical purposes; laser equipment for industrial use; laser equipment designed for cutting and drilling; laser equipment designed for cutting and drilling printed circuit boards, integrated circuits, and integrated circuit packaging and associated materials;Laser-based material processing systems for processing workpieces; Laser-based material processing systems for processing workpieces such as printed circuit boards, integrated circuits, and integrated circuit packaging and associated materials;

KELVIN KLAMPS

APPLICANT MAKES NO CLAIM TO EXCLUSIVE RIGHTS IN THE WORD KLAMPS.;CLAMP;MULTIPLE CONNECTOR FOR MAKING TWO SEPARATE CONNECTIONS TO EACH JUNCTION OF A TWO-JUNCTION IMPEDANCE ELEMENT;

KELVIN KLIPS

APPLICANT MAKES NO CLAIM TO EXCLUSIVE RIGHTS IN THE WORD KLIPS;CLIP;MULTIPLE CONNECTOR FOR MAKING TWO SEPARATE CONNECTIONS TO EACH JUNCTION OF A TWO-JUNCTION IMPEDANCE ELEMENT;

MICROLASE

Laser Apparatus and Structural Components Thereof Cutting and Otherwise Machining Mechanical and Electrical Products;

MICROSORT

Machine for testing the electrical properties of small metallic-ceramic devices used in micro-circuitry and classifying them according to their determined characteristics;MICRO SORT;

MICROTERM

Machine for testing the electrical properties of small metallic-ceramic devices used in micro-circuitry and classifying them according to their determined characteristics;MICRO TERM;

MICROVISION

COMPUTER PROGRAMS AND PROGRAM MANUALS SOLD AS A UNIT FOR USE IN MACHINE VISION AND IMAGE PROCESSING APPLICATIONS;

PORTAMETRIC

PORTABLE INSTRUMENTS FOR MEASURING ELECTRICAL CHARACTERISTICS;

PVB

POTENTIOMETRIC VOLTMETER BRIDGES;

SIGMACLEAN

laser marker for marking silicon wafers;SIGMA-CLEAN;

VERSITRIM

Software for laser-based systems for use in controlling lasers in the field of industrial manufacturing;

VIDEO BRIDGE

Microprocessor Controlled Electronic Bridges for Measuring and Visually Displaying Characteristics of Electrical Components;