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Welcome to the Brand page for “SURFACEWAVE”, which is offered here for Measurement metrology machines for measuring the thickness and properties of thin film that are deposited on silicon wafers to form semiconductor devices;surface wave;.
Its status is currently believed to be active. Its class is unavailable. “SURFACEWAVE” is believed to be currently owned by “Advanced Metrology Systems LLC”.
| Owner: |
ADVANCED METROLOGY SYSTEMS LLC
Owner Details |
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| Description: |
Measurement metrology machines for measuring the thickness and properties of thin film that are deposited on silicon wafers to form semiconductor devices;SURFACE WAVE;
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| Categories: | MEASUREMENT METROLOGY MACHINES MEASURING |