PIPE INSPECTION CAMERAS CAPTURING

Brand Owner (click to sort) Address Description
CSX SEESCAN, INC. Steven C. Tietsworth, General Counsel 3855 Ruffin Road San Diego CA 92123 Pipe inspection cameras for capturing images or video within utility pipes or other cavities; pipe inspection camera control units (CCUs) for controlling, receiving, displaying, or sending images or video from pipe inspection cameras; software for use with pipe inspection camera control units (CCUs) to receive or display images or videos from pipe inspection cameras; downloadable software for use on cellular phones, tablets, or computers to display, annotate, store, or send images, audio, or videos from pipe or cavity inspection operations;
CSX VIA SEESCAN, INC. Steven C. Tietsworth, General Counsel 3855 Ruffin Road San Diego CA 92123 Pipe inspection cameras for capturing images or video within utility pipes or other cavities; pipe inspection camera control units for controlling, receiving, displaying, or sending images or video from pipe inspection cameras; downloadable software for use with pipe inspection camera control units to receive or display images or videos from pipe inspection cameras; wireless routers; wireless transceiver radio; downloadable images and video recordings via the Internet and wireless devices in the field of pipe and cavity inspection; wireless communication devices for voice, data or image transmission; wireless transceiver radios;
 

Where the owner name is not linked, that owner no longer owns the brand

   
Technical Examples
  1. An operator-free and fully automated semiconductor inspection system with high throughput is realized. All conditions required for capturing and inspection are generated from design information such as CAD data. In order to perform actual inspection under the conditions, a semiconductor inspection system is composed of a navigation system for generating all the conditions required for capturing and inspection from the design information and a scanning electron microscope system for actually performing capturing and inspection. Moreover, in the case of performing a matching process between designed data and a SEM image, deformed parts are corrected by use of edge information in accordance with multiple directions and smoothing thereof. Furthermore, a SEM image corresponding to a detected position is re-registered as a template, and the matching process is thereby performed.