OPTICAL MEASURING INSTRUMENTS DETECTING

Brand Owner Address Description
WAFQSCAN ISRA VISION AG Industriestr. 14 64297 Darmstadt Germany Optical measuring instruments for detecting defects on the surfaces of semiconductor wafers and other thin film wafers;WAFQ SCAN;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. This invention is intended to reduce the cost by displaying the load information of a plurality of circuits with a single display device and transferring one of the two communication units in the measuring instruments from the measuring instruments to the display device to acquire the load information of a plurality of circuits. The display device and the measuring instruments are separated from each other, and the display device includes a plurality of communications units connectable with a plurality of devices, while each of many measuring instruments includes a single communication unit.