METROLOGY DEVICES

Brand Owner (click to sort) Address Description
CONTOUR ELITE Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Metrology devices, namely, surface profiling machines and optical microscopes for characterizing and measuring surface parameters of samples;
CONTOURGT Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Metrology devices, namely, surface profiling machines for measuring surface primary form, surface roughness and other surface parameters of samples;CONTOUR GT;
NUMEREX CARL ZEISS AG Carl-Zeiss-Strasse 22 Oberkochen 73447 Germany METROLOGY DEVICES, NAMELY -- COORDINATE MEASURING MACHINES AND PARTS THEREOF; ACCESSORIES FOR ALL THE FOREGOING, NAMELY -- PROBES, VIDEO DISPLAYS, COMPUTERS, COMPUTER KEYBOARDS, COMPUTER DISC DRIVES, VIDEO DISPLAY TERMINALS, AND ELECTRONIC PRINTERS;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method and an apparatus for organizing production data is provided. The method comprises performing at least one process run of semiconductor devices, and recording at least one manufacturing tag associated with the process run of semiconductor devices. The method further comprises performing metrology upon at least one process run of the semiconductor device for acquiring metrology data and for performing a metrology data stackification process upon the metrology data using the manufacturing tag for organizing and stacking the metrology data. The method further comprises modifying at least one control parameter is modified based upon the stacked metrology data.