HIGH TEMPERATURE METAL TESTING MACHINERY

Brand	Owner (click to sort)	Address	Description
GLEEBLE	DYNAMIC SYSTEMS INC.	323 Route 355 Poestenkill NY 12140	HIGH TEMPERATURE METAL TESTING MACHINERY AND APPARATUS, INCLUDING ELECTRONIC CONTROL CIRCUITS AND PARTS AND ACCESSORIES THEREFOR;
GLEEBLE	DUFFERS SCIENTIFIC INC.	R.D. #5, BOX 85 TROY NY 12180	HIGH TEMPERATURE METAL TESTING MACHINERY AND APPARATUS, INCLUDING ELECTRONIC CONTROL CIRCUITS AND PARTS AND ACCESSORIES THEREFOR;
GLEEBLE	DUFFERS ASSOCIATES, INC.	MAIN AVE. WYNANTSKILL NY	HIGH TEMPERATURE METAL TESTING MACHINERY AND APPARATUS, INCLUDING ELECTRONIC CONTROL CIRCUITS AND PARTS AND ACCESSORIES THEREFOR;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A test structure and a test methodology are provided for testing metal-insulator-metal (MIM) capacitor structures under high temperatures at the wafer level. The test structure includes a resistor formed on a region of dielectric isolation material formed in a semiconductor substrate. The MIM capacitor is formed over the resistor and separated therefrom by dielectric material. A metal thermometer, formed from the same material as the plates of the MIM capacitor, is placed above the resistor and in close proximity to the capacitor. High current is forced through the resistor, causing both the metal thermometer and the MIM capacitor to heat up along with the resistor. The change in resistance of the metal thermometer is monitored. Using the known temperature coeffecient of resistance (TCR) for the metal used to form both the capacitor and the thermometer, changes in the measured resistance of the metal thermometer are converted to temperature.