ELECTRO OPTICAL INSPECTION SYSTEMS CONSISTING

Brand Owner (click to sort) Address Description
ANGSTROM ANGSTROM TECHNOLOGIES, INC. 1895 Airport Exchange Blvd Suite #110 Erlanger KY 41018 ELECTRO-OPTICAL INSPECTION SYSTEMS CONSISTING OF AN ULTRAVIOLET LIGHT SOURCE, A SCANNER [ AND A PHOTOLUMINESCENT CHEMICAL MARKING ];PHOTOLUMINESCENT CHEMICALS USED FOR MARKING IN A WIDE VARIETY OF INDUSTRIES, INCLUDING BUT NOT LIMITED TO LABELING, ANTI-COUNTERFEITING AND DOCUMENT SECURITY, PRODUCT IDENTIFICATION, BAR CODE AND LABEL ORIENTATION, ROBOTIC VISION GUIDANCE, PACKAGING, PRODUCT ASSEMBLY, MATERIALS HANDLING AND QUALITY CONTROL;
ANGSTROM ANGSTROM TECHNOLOGIES, INC. 1895 Airport Exchange Blvd Suite #110 Erlanger KY 41018 ELECTRO-OPTICAL INSPECTION SYSTEMS CONSISTING OF AN ULTRAVIOLET LIGHT SOURCE, A SCANNER AND A PHOTOLUMINESCENT CHEMICAL MARKING;PHOTOLUMINESCENT CHEMICALS USED FOR MARKING IN A WIDE VARIETY OF INDUSTRIES INCLUDING LABELING, ANTI-COUNTERFEITING AND DOCUMENT SECURITY, PRODUCT IDENTIFICATION, BAR CODE AND LABEL ORIENTATION, ROBOTIC VISION GUIDANCE, PACKAGING, PRODUCT ASSEMBLY, MATERIALS HANDLING AND QUALITY CONTROL;
PHOTOMOLECULAR ANGSTROM TECHNOLOGIES, INC. 1895 Airport Exchange Blvd Suite #110 Erlanger KY 41018 ELECTRO-OPTICAL INSPECTION SYSTEMS CONSISTING OF AN ULTRAVIOLET LIGHT SOURCE, A SCANNER AND A PHOTOLUMINESCENT CHEMICAL MARKING;PHOTOLUMINESCENT CHEMICALS USED FOR MARKING;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The object of the present invention is to provide an inspection apparatus for liquid crystal drive substrates that improves the inspection accuracy of liquid crystal drive substrates, judges defect type more accurately, and does not cause a decrease in throughput. In order to achieve this object, the present invention provides an inspection apparatus for liquid crystal drive substrates that discriminates defective pixels having an abnormal voltage and normal pixels having a normal voltage based on pixel voltage by arranging an electro-optical element plate in opposition to a liquid crystal drive substrate on which pixel electrodes are arranged in the form of a matrix, and calculating the actual voltage of each pixel electrode in the form of a pixel voltage based on the voltage image of the electro-optical element plate obtained by writing a prescribed voltage to the pixel electrodes, and on the electro-optical characteristics of the above electro-optical element plate, wherein the inspection apparatus comprises an image processing apparatus that an image processing apparatus that classifies pixel electrodes of defect candidates for each defect type by comparing said pixel voltage with a threshold value set for each defect type of pixel defect, and finally judges said pixel electrodes of defect candidates for each defect type as defective pixels of each defect type based on judgment conditions provided for each defect type.