ELECTRICAL EDDY CURRENT TEST EQUIPMENT

Brand Owner (click to sort) Address Description
CAL TEST ELECTRONICS Cal Test Electronics, Inc. 22820 Savi Ranch Parkway Yorba Linda CA 92887 Electrical eddy current test equipment; electrical outlet testers; probes for testing integrated circuits and semiconductors; probes for scientific purposes; analog and digital multimeters; voltage testers; splices for electrical transmission lines; plug adaptors; plug and power connectors; coaxial cables and relays; electrical plugs; electric wire and cable; power supplies; power supply connectors and adaptors for use with portable electronic devices; frequency meters and stabilizers; frequency converters and meters; electronic detectors for observing and measuring the infrared spectrum, namely, infrared detectors;CALIFORNIA TEST ELECTRONICS;TEST ELECTRONICS;
CR-11 Criterion NDT, Inc. 3702 W. Valley Hwy N, Ste 202 Auburn WA 98001 Electrical eddy current test equipment;CRITERION- ELEVEN;
CRITERION NDT Criterion NDT, Inc. 3702 W. Valley Hwy N, Ste 202 Auburn WA 98001 Electrical eddy current test equipment;
ECTANE EDDYFI CANADA INC. 3425 PIERRE-ARDOUIN STREET QUEBEC, QUEBEC G1P 0B3 Canada Electrical eddy current test equipment;Installation and maintenance of electrical eddy current test equipment;
EDDYFI EDDYFI CANADA INC. 3425 PIERRE-ARDOUIN STREET QUEBEC, QUEBEC G1P 0B3 Canada Electrical eddy current test equipment;Installation and maintenance of electrical eddy current test equipment;Research and development in the field of electrical eddy current test equipment;
EDDYPEN CoreStar International Corporation 1044 Sandy Hill Road Irwin PA 15642 Electrical eddy current test equipment;EDDY PEN;
EVI United Western Technologies Corp 122 South 4th Avenue Pasco WA 99301 Electrical eddy current test equipment;
JET JENTEK Sensors, Inc. 121 Bartlett Street Marlborough MA 01752 Electrical eddy current test equipment;
JETI JENTEK Sensors, Inc. 121 Bartlett Street Marlborough MA 01752 Electrical eddy current test equipment; Handheld computers;JET I;
LYFT EDDYFI CANADA INC. 3425 PIERRE-ARDOUIN STREET QUEBEC, QUEBEC G1P 0B3 Canada Electrical eddy current test equipment;Maintenance of electrical eddy current test equipment;LIFT;Calibration of electrical eddy current test equipment;
MAGNIFI EDDYFI NDT Inc. 360, Rue Franquet, Suite 40 G1P 4N3 Quebec City (QC) Canada Electrical eddy current test equipment;Installation and maintenance of electrical eddy current test equipment;MAGINIFY;
REDDY EDDYFI CANADA INC. 3425 PIERRE-ARDOUIN STREET QUEBEC, QUEBEC G1P 0B3 Canada Electrical eddy current test equipment;Maintenance of electrical eddy current test equipment;Color is not claimed as a feature of the mark.;Calibration of electrical eddy current test equipment;
ST-11 Criterion NDT, Inc. 3702 W. Valley Hwy N, Ste 202 Auburn WA 98001 Electrical eddy current test equipment;ST-ELEVEN;
ST-11R Criterion NDT, Inc. 3702 W. Valley Hwy N, Ste 202 Auburn WA 98001 Electrical eddy current test equipment;ST- ELEVEN R; ST- ONE ONE R;
UNIWEST United Western Technologies Corp 122 South 4th Avenue Pasco WA 99301 Electrical eddy current test equipment; Ultrasound inspection devices for non-medical, non-destructive testing;UNI WEST; UNIT WEST;
ZEPHYR WESTINGHOUSE ELECTRIC COMPANY Suite 141 1000 Westinghouse Drive Cranberry Township PA 16066 Electrical eddy current test equipment for inspecting heat exchange tubes in nuclear system heat exchangers;
ZID ZETEC, INC. 8226 Bracken Place SE, Suite 100 Snoqualmie WA 98065 Electrical eddy current test equipment for identifying and controlling eddy current probes used for acquiring and processing eddy current signals in non-destructive testing of physical materials;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method for minimizing measuring spot size and noise during film thickness measurement is provided. The method initiates with locating a first eddy current sensor directed toward a first surface associated with a conductive film. The method includes locating a second eddy current sensor directed toward a second surface associated with the conductive film. The first and second eddy current sensors may share a common axis or be offset from each other. The method further includes alternating power supplied to the first eddy current sensor and the second eddy current sensor, such that the first eddy current sensor and the second eddy current sensor are powered one at a time. In one aspect of the invention, a delay time is incorporated between switching power between the first eddy current sensor and the second eddy current sensor. The method also includes calculating the film thickness measurement based on a combination of signals from the first eddy current sensor and the second eddy current sensor. An apparatus and a system are also provided.