ELECTRIC MICROMETERS

Brand Owner Address Description
SURFCOM TOKYO SEIMITSU CO., LTD. 2968-2, Ishikawa-machi Hachioji Tokyo 192-8515 Japan [ ELECTRIC MICROMETERS, ] ELECTRO-MECHANICAL INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS [ , TRACING DRIVERS AND OTHER COMPONENTS THEREOF AND ACCESSORIES THEREFOR ];
 

Where the owner name is not linked, that owner no longer owns the brand

   
Technical Examples
  1. SiC at least about 400 micrometers thick, and preferably within the range of about 400-2,000 micrometers thick, is employed to detect electromagnetic radiation having a wavelength less than about 10 micrometers via an acoustic absorption mechanism. The SiC body preferably has a non-dopant impurity level low enough that it does not interfere with a single crystal structure for the SiC, and an approximately uniform thickness with an approximately flat radiation receiving surface.