AUTOMATIC TEST EQUIPMENT COMPRISED

Brand Owner (click to sort) Address Description
ETS-200 EAGLE TEST SYSTEMS, INC. 600 RIVERPARK DRIVE NR700-2-3 NORTH READING MA 01864 Automatic Test Equipment comprised of computer(s), computer software, and various product-specific circuit boards used to test integrated circuits, resistors, capacitors, semiconductors;
ETS-200T EAGLE TEST SYSTEMS, INC. 600 RIVERPARK DRIVE NR700-2-3 NORTH READING MA 01864 Automatic Test Equipment comprised of computer(s), computer software, and various product-specific circuit boards used to test integrated circuits, resistors, capacitors, semiconductors;
ETS-300 EAGLE TEST SYSTEMS, INC. 600 RIVERPARK DRIVE NR700-2-3 NORTH READING MA 01864 Automatic Test Equipment comprised of compute(s), computer software, and various product-specific circuit boards used to test integrated circuits, resistors, capacitors, semiconductors;EAGLE TEST SYSTEMS-300 ETS-THREE HUNDRED EAGLE TEST SYSTEMS-THREE HUNDRED;
ETS-364 EAGLE TEST SYSTEMS, INC. 600 RIVERPARK DRIVE NR700-2-3 NORTH READING MA 01864 Automatic Test Equipment comprised of computer(s), computer software, and various circuit boards used to test integrated circuits, resistors, capacitors, semiconductors;
PATRIOT EAGLE TEST SYSTEMS, INC. 600 RIVERPARK DRIVE NR700-2-3 NORTH READING MA 01864 Automatic Test Equipment comprised of computer(s), computer software, and various product-specific circuit boards used to test integrated circuits, resistors, capacitors, semiconductors and the like;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The invention relates to a design analysis technique for a test pattern analysis of chips via automatic test equipment (ATE) or a circuit simulation to detect potential design weakness or abnormal behavior in real customer application faults. Problems are solved by comprising a simulation procedure stored in an LRT database of automatic test equipment (ATE), defining test conditions and test patterns which execute and generate continuously for a time given by a user, applying the test stimuli and test conditions to a device under test (DUT) and starting the long running test (LRT), stopping the test automatically if any application faults occur and logging the failure time and timely test sequence and starting another test again until a given maximum number of tests are reached.