ELECTROCARDIOGRAPHS STRESS TEST MODULES

Brand	Owner	Address	Description
SICARD	SIEMENS-ELEMA AB	ROENTGENVAEGEN 2 S-17195 SOLNA Sweden	electrocardiographs and stress test modules used therewith;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

An integrated circuit can have plural core circuits, each having a test access port that is defined in IEEE standard 1149.1. Access to and control of these ports is though a test linking module. The test access ports on an integrated circuit can be arranged in a hierarchy with one test linking module controlling access to plural secondary test linking modules and test access ports. Each secondary test linking module in turn can also control access to tertiary test linking modules and test access ports. The test linking modules can also be used for emulation.