CHEMICAL COLUMNS USE

Brand Owner (click to sort) Address Description
AD DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan chemical columns for use in liquid chromatography;
AD-H DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan Chemical columns for use in liquid chromatography;
AD-RH DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan Chemical columns for use in liquid chromatography;
AS DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan chemical columns for use in liquid chromatography;
AS-H DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan Chemical columns for use in liquid chromatography;
AS-RH DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan Chemical columns for use in liquid chromatography;
CR DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan chemical columns for use in liquid chromatography;
OD DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan chemical columns for use in liquid chromatography;
OD-H DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan chemical columns for use in liquid chromatography;
OD-R DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan chemical columns for use in liquid chromatography;
OD-RH DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan Chemical columns for use in liquid chromatography;
OJ DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan chemical columns for use in liquid chromatography;
OJ-H DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan Chemical columns for use in liquid chromatography;
OJ-RH DAICEL CORPORATION 3-1, Ofuka-cho, Kita-ku, Osaka-shi Osaka 530-0011 Japan Chemical columns for use in liquid chromatography;
 

Where the owner name is not linked, that owner no longer owns the brand

   
Technical Examples
  1. A non-volatile memory wherein bad columns in the array of memory cells can be removed. Substitute redundant columns can replace the removed columns. Both of these processes are performed on the memory in a manner that is externally transparent and, consequently, need not be managed externally by the host or controller to which the memory is attached. The bad column can be maintained on the memory. At power up, the list of bad columns is used to fuse out the bad columns. The memory may also contain a number of redundant columns that can be used to replace the bad columns.